Metal organic chemical vapor deposition and investigation of ZnO thin films grown on sapphire

Thin Solid Films

Volumn 516, Issue 16, 2008, Pages 5571-5576

  Sun, S ^a   Tompa, G S ^a   Rice, C ^a   Sun, X W ^b   Lee, Z S ^c   Lien, S C ^c   Huang, C W ^c   Cheng, L C ^c   Feng, Z C ^c  

^a STRUCTURED MATERIALS INDUSTRIES INC   (United States)

^b NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

^c NATIONAL TAIWAN UNIVERSITY   (Taiwan)

Author keywords

MOCVD; Photoluminescence; Raman scattering; Synchrotron radiation; X ray diffraction; ZnO

Indexed keywords

FILM GROWTH; METALLORGANIC CHEMICAL VAPOR DEPOSITION; PHOTOLUMINESCENCE; SAPPHIRE; SYNCHROTRON RADIATION; X RAY DIFFRACTION ANALYSIS; ZINC OXIDE;

CRYSTALLINE QUALITY; EPI FILMS; SAPPHIRE SUBSTRATES; ULTRAVIOLET VISIBLE OPTICAL TRANSMISSION;

THIN FILMS;

EID: 43949141728     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2007.07.030     Document Type: Article

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