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Volumn 516, Issue 16, 2008, Pages 5419-5423
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Bias effect on microstructure and mechanical properties of magnetron sputtered nanocrystalline titanium carbide thin films
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Author keywords
Magnetron sputtering; Mechanical properties; Substrate bias; TiC
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Indexed keywords
MAGNETRON SPUTTERING;
MICROSTRUCTURE;
NANOCRYSTALLINE MATERIALS;
NANOINDENTATION;
SPUTTER DEPOSITION;
TITANIUM CARBIDE;
TOUGHNESS;
X RAY DIFFRACTION ANALYSIS;
FIELD EMISSION SCANNING ELECTRON MICROSCOPY;
NANOINDENTATION HARDNESS;
SCANNING MICROSCRATCH;
SUBSTRATE BIAS;
THIN FILMS;
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EID: 43949088144
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/j.tsf.2007.07.022 Document Type: Article |
Times cited : (94)
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References (21)
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