Versatile method for optical performances characterization of off-axis CMOS pixels with microlens radial shift

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 6817, Issue , 2008, Pages

  Vaillant, Jérôme ^a   Decroux, Thomas ^a   Huss, Emilie ^a   Barbier, Frédéric ^a   Hérault, Didier ^a   Hirigoyen, Flavien ^a   Virollet, Nicolas ^a  

^a STMICROELECTRONICS   (France)

Author keywords

Characterization; CMOS image sensors; Pixel

Indexed keywords

CMOS INTEGRATED CIRCUITS; IMAGE RESOLUTION; IMAGE SENSORS; MICROELECTRONICS; MICROLENSES; OPTIMIZATION;

PIXEL ARCHITECTURE; RADIAL SHIFT;

PIXELS;

EID: 43649108068     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.766463     Document Type: Conference Paper

References (6)

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