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Volumn 22, Issue 4, 2004, Pages 1524-1529
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Modeling of the target surface modification by reactive ion implantation during magnetron sputtering
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Author keywords
[No Author keywords available]
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Indexed keywords
INCIDENT ENERGY;
MAGNETRON DISCHARGE;
REACTIVE ION IMPLANTATION;
SURFACE CONCENTRATION;
ALUMINA;
ARGON;
COMPUTER SIMULATION;
ELECTRIC DISCHARGES;
ELECTRIC POTENTIAL;
EROSION;
ION BOMBARDMENT;
ION IMPLANTATION;
MAGNETRON SPUTTERING;
MONTE CARLO METHODS;
OXYGEN;
SILICON NITRIDE;
SURFACE TREATMENT;
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EID: 4344710659
PISSN: 07342101
EISSN: None
Source Type: Journal
DOI: 10.1116/1.1705641 Document Type: Conference Paper |
Times cited : (17)
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References (11)
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