Radiation-induced statistical uncertainty in the threshold voltage measurement of MOSFET dosimeters

Physics in Medicine and Biology

Volumn 49, Issue 14, 2004, Pages 3145-3159

  Benson, Chris ^a,e   Price, Robert A ^b   Silvie, Jon ^c   Jaksic, Aleksandar ^d   Joyce, Malcolm J ^a  

^a LANCASTER UNIVERSITY   (United Kingdom)

^b CLATTERBRIDGE CENTRE FOR ONCOLOGY   (United Kingdom)

^c BAE SYSTEMS   (United Kingdom)

^d UNIVERSITY COLLEGE CORK   (Ireland)

^e Appleyard Lees   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

INTER-DEVICE UNCERTAINTY; KURTOSIS;

DOSIMETERS; IRRADIATION; STATISTICAL METHODS; THRESHOLD VOLTAGE;

MOSFET DEVICES;

ANALYTIC METHOD; ARTICLE; CONTROLLED STUDY; DOSIMETER; DOSIMETRY; ELECTRIC POTENTIAL; LIGHT; NONLINEAR SYSTEM; PRIORITY JOURNAL; RADIATION DOSE; RADIATION EQUIPMENT; SEMICONDUCTOR; SIGNAL NOISE RATIO; STATISTICAL ANALYSIS; STATISTICAL CONCEPTS; UNCERTAINTY;

ALGORITHMS; CALIBRATION; DOSE-RESPONSE RELATIONSHIP, RADIATION; HUMANS; LIPIDS; MODELS, STATISTICAL; MODELS, THEORETICAL; MONTE CARLO METHOD; NORMAL DISTRIBUTION; PARTICLE ACCELERATORS; PHOTONS; RADIATION; RADIATION DOSAGE; RADIOMETRY; RADIOTHERAPY; RADIOTHERAPY DOSAGE; RADIOTHERAPY PLANNING, COMPUTER-ASSISTED; REPRODUCIBILITY OF RESULTS; SENSITIVITY AND SPECIFICITY; SOFTWARE;

EID: 4344693348     PISSN: 00319155     EISSN: None     Source Type: Journal    
DOI: 10.1088/0031-9155/49/14/009     Document Type: Article

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