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Volumn 203, Issue 3-6, 2002, Pages 213-223

A parametric method applied to phase recovery from a fringe pattern based on a genetic algorithm

Author keywords

Fringe analysis; Genetic algorithms; Optical metrology; Phase retrieval

Indexed keywords

CHROMOSOMES; DEMODULATION; GENETIC ALGORITHMS; IMAGE ANALYSIS; PARAMETER ESTIMATION;

EID: 0037086635     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0030-4018(02)01132-X     Document Type: Article
Times cited : (44)

References (22)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.