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Volumn 212, Issue 1-3, 2002, Pages 35-43
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Dynamic ESPI with subtraction-addition method for obtaining the phase
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Author keywords
Dynamic ESPI; Gaussian filter; In situ observations; Phase analysis; Plastic deformation
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Indexed keywords
CHARGE COUPLED DEVICES;
DEFORMATION;
IMAGE PROCESSING;
INTERFEROMETRY;
PHASE MODULATION;
SPECKLE;
DYNAMIC ELECTRONIC SPECKLE PATTERN INTERFEROMETRY (DESPI);
OPTICAL COMMUNICATION;
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EID: 0037107910
PISSN: 00304018
EISSN: None
Source Type: Journal
DOI: 10.1016/S0030-4018(02)01909-0 Document Type: Article |
Times cited : (32)
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References (17)
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