Correlated structural and magnetization reversal studies on epitaxial Ni films grown with molecular beam epitaxy and with sputtering

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Volumn 22, Issue 4, 2004, Pages 1868-1872

  Zhang, Zhengdong ^a   Lukaszew, R A ^a   Cionca, C ^b   Pan, X ^b   Clarke, R ^b   Yeadon, M ^c   Zambano, A ^d   Walko, D ^e   Dufresne, E ^e   Te Velthius, Suzanne ^e  

^a UNIVERSITY OF TOLEDO   (United States)

^b UNIVERSITY OF MICHIGAN   (United States)

^c NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

^d MICHIGAN STATE UNIVERSITY   (United States)

^e ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY (HRTEM); HYBRIDIZATION; NICKEL NI FILMS; POLARIZED NEUTRON REFLECTIVITY (PNR);

AMORPHOUS FILMS; ANNEALING; CRYSTALLOGRAPHY; ELECTRONIC STRUCTURE; MAGNETIZATION; METALLIC FILMS; MOLECULAR BEAM EPITAXY; NICKEL; STRAIN; SUBSTRATES;

FILM GROWTH;

EID: 4344661891     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.1692292     Document Type: Conference Paper

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