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Volumn 462-463, Issue SPEC. ISS., 2004, Pages 161-167

Peeling and delamination in Cu/SiLK™ process during Cu-CMP

Author keywords

CMP; Cu SiLK; Delamination and critical pressure; Peeling

Indexed keywords

CHEMICAL MECHANICAL PLANARIZATION (CMP); CMP; CRITICAL PRESSURES; CU/SILK;

EID: 4344597872     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2004.05.090     Document Type: Article
Times cited : (25)

References (12)
  • 3
    • 4344659672 scopus 로고    scopus 로고
    • S. Balakumar, X.T. Chen, Y.W. Chen (to be submitted)
    • S. Balakumar, X.T. Chen, Y.W. Chen (to be submitted).
  • 5
    • 1642595224 scopus 로고    scopus 로고
    • November. IMIC Publishers
    • Hara T. Proceedings of VMIC Asia. 2002 (November);161 IMIC Publishers. ( http://www.imic.org ).
    • (2002) Proceedings of VMIC Asia , pp. 161
    • Hara, T.1
  • 11
    • 0842307782 scopus 로고    scopus 로고
    • Kondo S., et al. IITC. 2003;86.
    • (2003) IITC , pp. 86
    • Kondo, S.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.