|
Volumn 462-463, Issue SPEC. ISS., 2004, Pages 161-167
|
Peeling and delamination in Cu/SiLK™ process during Cu-CMP
|
Author keywords
CMP; Cu SiLK; Delamination and critical pressure; Peeling
|
Indexed keywords
CHEMICAL MECHANICAL PLANARIZATION (CMP);
CMP;
CRITICAL PRESSURES;
CU/SILK;
ADHESION;
CHEMICAL MECHANICAL POLISHING;
DELAMINATION;
INTEGRATED CIRCUIT MANUFACTURE;
METALLIZING;
PEELING;
PERMITTIVITY;
POROUS MATERIALS;
PRESSURE EFFECTS;
COPPER;
|
EID: 4344597872
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/j.tsf.2004.05.090 Document Type: Article |
Times cited : (25)
|
References (12)
|