Preparation of ternary alloy libraries for high-throughput screening of material properties by means of thick film deposition and interdiffusion: Benefits and limitations

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Volumn 22, Issue 4, 2004, Pages 1788-1792

  Rar, A ^a,b   Specht, E D ^a   George, E P ^a,c   Santella, M L ^a   Pharr, G M ^a,c  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b University of Tennessee Knoxville   (United States)

^c Dept of Mat Sci and Engineering ^*  (United States)

Author keywords

[No Author keywords available]

Indexed keywords

LINEAR THICKNESS GRADIENT; SYNCHROTON RADIATIONS; TERNARY ALLOY LIBRARIES; X-RAY DIFFRACTION MAPPING;

ANNEALING; CRYSTAL ORIENTATION; INTERDIFFUSION (SOLIDS); MATHEMATICAL MODELS; PHASE DIAGRAMS; QUARTZ; SYNCHROTRONS; THICK FILMS; TRANSITION METAL ALLOYS; VACUUM APPLICATIONS; X RAY DIFFRACTION;

TERNARY SYSTEMS;

EID: 4344586759     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.1692366     Document Type: Conference Paper

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