Low energy electron diffraction analysis of ultrathin Ag films on W(110)

Surface Review and Letters

Volumn 5, Issue 6, 1998, Pages 1143-1149

  Poon, H C ^a   Tong, S Y ^a   Chung, W F ^b   Altman, M S ^b  

^a UNIVERSITY OF HONG KONG   (Hong Kong)

^b HONG KONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Hong Kong)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 1442287819     PISSN: 0218625X     EISSN: None     Source Type: Journal    
DOI: 10.1142/S0218625X9800147X     Document Type: Article

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