Structural characterization of polycrystalline Sb2O3 thin films prepared by thermal vacuum evaporation technique

Journal of Crystal Growth

Volumn 269, Issue 2-4, 2004, Pages 392-400

  Tigau, N ^a   Ciupina, V ^b   Prodan, G ^b   Rusu, G I ^c   Vasile, E ^d  

^a DUNAREA DE JOS UNIVERSITY OF GALATI   (Romania)

^b OVIDIUS UNIVERSITY   (Romania)

^c ALEXANDRU IOAN CUZA UNIVERSITY OF IASI   (Romania)

^d Metav SA Bucuresti   (Romania)

Author keywords

A1. Atomic force microscopy; A1. Crystallites; A1. X ray diffraction; A3. Polycrystalline deposition

Indexed keywords

ANTIMONY COMPOUNDS; ATOMIC FORCE MICROSCOPY; ELECTRON DIFFRACTION; EVAPORATION; GLASS; GRAIN SIZE AND SHAPE; LATTICE CONSTANTS; POLYCRYSTALLINE MATERIALS; SCANNING ELECTRON MICROSCOPY; SUBSTRATES; TRANSMISSION ELECTRON MICROSCOPY; VACUUM; X RAY DIFFRACTION ANALYSIS;

CRYSTALLITES; POLYCRYSTALLINE DEPOSITION; ROUGHNESS PARAMETERS; STRUCTURAL CHARACTERIZATION;

THIN FILMS;

EID: 4344567863     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2004.05.052     Document Type: Article

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