Preparation and characterization of Sb2S3 thin films using a successive ionic layer adsorption and reaction (SILAR) method

Journal of Materials Science Letters

Volumn 18, Issue 18, 1999, Pages 1453-1455

  Sankapal, B R ^a   Mane, R S ^a   Lokhande, C D ^a  

^a SHIVAJI UNIVERSITY   (India)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL STRUCTURE; DEPOSITION; ELECTRIC CONDUCTIVITY; FILM PREPARATION; GLASS; MECHANICAL PROPERTIES; OPTICAL PROPERTIES; PH; POSITIVE IONS; SEMICONDUCTING ANTIMONY COMPOUNDS; SUBSTRATES; TEMPERATURE CONTROL;

ANTIMONY TRIOXIDE; IMMERSION; SODIUM THIOSULPHATE; SUCCESSIVE IONIC LAYER ADSORPTION AND REACTION; THICKNESS;

THIN FILMS;

EID: 0033189105     PISSN: 02618028     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1006613510968     Document Type: Article

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