Preparation and characterization of 3-mercaptopropyl trimethoxysilane self-assembled monolayers

Journal of University of Science and Technology Beijing: Mineral Metallurgy Materials (Eng Ed)

Volumn 15, Issue 2, 2008, Pages 192-196

  Bai, Tao ^a   Cheng, Xianhua ^a  

^a SHANGHAI JIAO TONG UNIVERSITY   (China)

Author keywords

atomic force microscopy (AFM); characterization; mercaptopropyl trimethoxysilane (MPTS); self assembly; thin films

Indexed keywords

ATOMIC FORCE MICROSCOPY; CONTACT ANGLE; COUPLING AGENTS; FILM PREPARATION; PHASE BEHAVIOR; SILANES; SINGLE CRYSTAL SURFACES; THIN FILMS;

CHEMICAL STATES; IMMERSION; MERCAPTOPROPYL TRIMETHOXYSILANES; SILICON SUBSTRATES;

SELF ASSEMBLED MONOLAYERS;

EID: 43249109317     PISSN: 10058850     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1005-8850(08)60037-7     Document Type: Article

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