Tied factor analysis for face recognition across large pose differences

IEEE Transactions on Pattern Analysis and Machine Intelligence

Volumn 30, Issue 6, 2008, Pages 970-984

  Prince, Simon J D ^a   Elder, James H ^a   Warrell, Jonathan ^b   Felisberti, Fatima M ^c  

^a UNIVERSITY COLLEGE LONDON   (United Kingdom)

^b YORK UNIVERSITY   (Canada)

^c KINGSTON UNIVERSITY   (United Kingdom)

Author keywords

Applications; Computing methodologies; Face and gesture recognition; Pattern recognition

Indexed keywords

ALGORITHMS; GESTURE RECOGNITION; MATHEMATICAL MODELS; MATHEMATICAL TRANSFORMATIONS; PROBABILITY;

FACE RECOGNITION ALGORITHMS; LINEAR TRANSFORMATION; TIED FACTOR ANALYSIS;

FACE RECOGNITION;

ALGORITHM; ARTICLE; ARTIFICIAL INTELLIGENCE; AUTOMATED PATTERN RECOGNITION; BIOMETRY; COMPUTER ASSISTED DIAGNOSIS; EVALUATION; FACE; FACIAL EXPRESSION; FACTORIAL ANALYSIS; HISTOLOGY; HUMAN; IMAGE ENHANCEMENT; IMAGE SUBTRACTION; METHODOLOGY; REPRODUCIBILITY; SENSITIVITY AND SPECIFICITY; STATISTICAL MODEL;

ALGORITHMS; ARTIFICIAL INTELLIGENCE; BIOMETRY; FACE; FACIAL EXPRESSION; FACTOR ANALYSIS, STATISTICAL; HUMANS; IMAGE ENHANCEMENT; IMAGE INTERPRETATION, COMPUTER-ASSISTED; LIKELIHOOD FUNCTIONS; PATTERN RECOGNITION, AUTOMATED; REPRODUCIBILITY OF RESULTS; SENSITIVITY AND SPECIFICITY; SUBTRACTION TECHNIQUE;

EID: 43249098320     PISSN: 01628828     EISSN: None     Source Type: Journal    
DOI: 10.1109/TPAMI.2008.48     Document Type: Article

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