Appearance-based face recognition and light-fields

IEEE Transactions on Pattern Analysis and Machine Intelligence

Volumn 26, Issue 4, 2004, Pages 449-465

  Gross, Ralph ^a   Matthews, Iain ^a   Baker, Simon ^a  

^a CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

Appearance based object recognition; Eigen light fields; Face recognition; Face recognition across pose; Light fields

Indexed keywords

ALGORITHMS; FEATURE EXTRACTION; LIGHT EMISSION; OBJECT RECOGNITION;

APPEARANCE-BASED OBJECT RECOGNITION; FACE RECOGNITION ACROSS POSE; LIGHT FIELDS;

FACE RECOGNITION;

ALGORITHM; ARTICLE; ARTIFICIAL INTELLIGENCE; AUTOMATED PATTERN RECOGNITION; COMPARATIVE STUDY; COMPUTER ASSISTED DIAGNOSIS; COMPUTER SIMULATION; EVALUATION; FACE; HISTOLOGY; HUMAN; IMAGE ENHANCEMENT; IMAGE SUBTRACTION; INFORMATION RETRIEVAL; LIGHT; MALE; MATHEMATICAL COMPUTING; METHODOLOGY; PHOTOGRAPHY; PHOTOMETRY; REPRODUCIBILITY; SENSITIVITY AND SPECIFICITY; SIGNAL PROCESSING; VALIDATION STUDY;

ALGORITHMS; ARTIFICIAL INTELLIGENCE; COMPUTER SIMULATION; FACE; HUMANS; IMAGE ENHANCEMENT; IMAGE INTERPRETATION, COMPUTER-ASSISTED; INFORMATION STORAGE AND RETRIEVAL; LIGHT; MALE; NUMERICAL ANALYSIS, COMPUTER-ASSISTED; PATTERN RECOGNITION, AUTOMATED; PHOTOGRAPHY; PHOTOMETRY; REPRODUCIBILITY OF RESULTS; SENSITIVITY AND SPECIFICITY; SIGNAL PROCESSING, COMPUTER-ASSISTED; SUBTRACTION TECHNIQUE;

EID: 1842478907     PISSN: 01628828     EISSN: None     Source Type: Journal    
DOI: 10.1109/TPAMI.2004.1265861     Document Type: Article

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