Learning patch dependencies for improved pose mismatched face verification

Proceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition

Volumn 1, Issue , 2006, Pages 909-915

  Lucey, Simon ^a   Tsuhan, Chen ^a  

^a CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FACE IMAGES; PATCH DEPENDENCIES; STATISTICAL DEPENDENCY;

ALGORITHMS; DATABASE SYSTEMS; IMAGE ANALYSIS; ROBUSTNESS (CONTROL SYSTEMS);

FACE RECOGNITION;

EID: 33845561941     PISSN: 10636919     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CVPR.2006.172     Document Type: Conference Paper

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