|
Volumn 266, Issue 8, 2008, Pages 1257-1260
|
Studies of InP nano dots formation after keV Ar+ irradiation
|
Author keywords
61.82.Fk; 68.37.Ps; 81.16.Dn; 81.16.Rf; Atomic force microscopy; III V semiconductors; Ion beam; Nanoscale pattern formation; Sputtering
|
Indexed keywords
ATOMIC FORCE MICROSCOPY;
COARSENING;
SEMICONDUCTING INDIUM PHOSPHIDE;
SPUTTERING;
NANO DOTS;
NANOSCALE PATTERN FORMATION;
SURFACE SMOOTHENING;
NANOSTRUCTURED MATERIALS;
|
EID: 43049183591
PISSN: 0168583X
EISSN: None
Source Type: Journal
DOI: 10.1016/j.nimb.2007.12.109 Document Type: Article |
Times cited : (6)
|
References (16)
|