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Volumn 266, Issue 8, 2008, Pages 1257-1260

Studies of InP nano dots formation after keV Ar+ irradiation

Author keywords

61.82.Fk; 68.37.Ps; 81.16.Dn; 81.16.Rf; Atomic force microscopy; III V semiconductors; Ion beam; Nanoscale pattern formation; Sputtering

Indexed keywords

ATOMIC FORCE MICROSCOPY; COARSENING; SEMICONDUCTING INDIUM PHOSPHIDE; SPUTTERING;

EID: 43049183591     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2007.12.109     Document Type: Article
Times cited : (6)

References (16)
  • 12
    • 43049156754 scopus 로고    scopus 로고
    • D. Paramanik, S.Majumdar, S.R. Sahoo, S.N. Sahu, S.Varma, J. Appl. Phys., submitted for publication.
    • D. Paramanik, S.Majumdar, S.R. Sahoo, S.N. Sahu, S.Varma, J. Appl. Phys., submitted for publication.
  • 13
    • 55849131485 scopus 로고    scopus 로고
    • D. Paramanik, S.Majumdar, S.R. Sahoo, S.Varma, J. Nanosci. Nanotech. 8 (2008), in press.
    • D. Paramanik, S.Majumdar, S.R. Sahoo, S.Varma, J. Nanosci. Nanotech. 8 (2008), in press.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.