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Volumn 354, Issue 27, 2008, Pages 3129-3134
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Thickness dependence of crystallization and melting kinetics of eutectic Sb70Te30 phase change recording film
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Author keywords
Amorphous semiconductors; Crystallization; Structure; Time resolved measurements
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Indexed keywords
ACTIVATION ENERGY;
AMORPHOUS SEMICONDUCTORS;
ANTIMONY ALLOYS;
CRYSTALLIZATION;
FILM THICKNESS;
PHASE CHANGE MATERIALS;
JOHNSON-MEHL-AVRAMI EQUATION;
PHASE CHANGE RECORDING FILMS;
THICKNESS DEPENDENCE;
TIME RESOLVED MEASUREMENTS;
EUTECTICS;
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EID: 43049164438
PISSN: 00223093
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jnoncrysol.2008.01.021 Document Type: Article |
Times cited : (17)
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References (25)
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