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Volumn 354, Issue 27, 2008, Pages 3129-3134

Thickness dependence of crystallization and melting kinetics of eutectic Sb70Te30 phase change recording film

Author keywords

Amorphous semiconductors; Crystallization; Structure; Time resolved measurements

Indexed keywords

ACTIVATION ENERGY; AMORPHOUS SEMICONDUCTORS; ANTIMONY ALLOYS; CRYSTALLIZATION; FILM THICKNESS; PHASE CHANGE MATERIALS;

EID: 43049164438     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnoncrysol.2008.01.021     Document Type: Article
Times cited : (17)

References (25)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.