Precise determination of anomalous scattering factors of Ge by using X-ray resonant scattering

Acta Crystallographica Section A: Foundations of Crystallography

Volumn 64, Issue 2, 2008, Pages 321-325

  Yoshizawa, Masami ^a   Zhou, Shengming ^b   Negishi, Riichirou ^a   Fukamachi, Tomoe ^a   Kawamura, Takaaki ^c  

^a SAITAMA INSTITUTE OF TECHNOLOGY   (Japan)

^b SHANGHAI INSTITUTE OF OPTICS AND FINE MECHANICS   (China)

^c UNIVERSITY OF YAMANASHI   (Japan)

Author keywords

Anomalous scattering factors of Ge; X ray resonant scattering

Indexed keywords

EID: 43049138446     PISSN: 01087673     EISSN: 16005724     Source Type: Journal    
DOI: 10.1107/S010876730800247X     Document Type: Article

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