Observation of interference fringes due to lattice distortion by resonant scattering X-ray topography

Physica Status Solidi (A) Applications and Materials Science

Volumn 204, Issue 8, 2007, Pages 2694-2699

  Negishi, Riichirou ^a   Fukamachi, Tomoe ^a   Yoshizawa, Masami ^a   Hirano, Keiichi ^b   Kawamura, Takaaki ^c  

^a SAITAMA INSTITUTE OF TECHNOLOGY   (Japan)

^b INSTITUTE OF MATERIALS STRUCTURE SCIENCE   (Japan)

^c UNIVERSITY OF YAMANASHI   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECT SHIFTS; INTERFERENCE FRINGES;

CRYSTAL LATTICES; FOURIER TRANSFORMS; IMAGE RECONSTRUCTION; TOPOGRAPHY; X RAY SCATTERING;

SEMICONDUCTING GALLIUM ARSENIDE;

EID: 34548201672     PISSN: 18626300     EISSN: 18626319     Source Type: Journal    
DOI: 10.1002/pssa.200675662     Document Type: Article

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