Analysis of key comparison data and laboratory biases

Metrologia

Volumn 45, Issue 2, 2008, Pages 211-216

  Chunovkina, A G ^a   Elster, C ^b   Lira, I ^c   Woger W ^b  

^a D I MENDELEYEV INSTITUTE FOR METROLOGY   (Russian Federation)

^b PHYSIKALISCH TECHNISCHE BUNDESANSTALT   (Germany)

^c PONTIFICIA UNIVERSIDAD CATÓLICA DE CHILE   (Chile)

Author keywords

[No Author keywords available]

Indexed keywords

ENGINEERING RESEARCH; MATHEMATICAL MODELS; PROBABILITY DENSITY FUNCTION; UNCERTAINTY ANALYSIS;

LABORATORY BIASES; TRAVELLING STANDARDS;

UNITS OF MEASUREMENT;

EID: 43049094796     PISSN: 00261394     EISSN: 16817575     Source Type: Journal    
DOI: 10.1088/0026-1394/45/2/010     Document Type: Article

References (45)

1. Bureau International des Poids et Mesures 1999 Mutual Recognition of National Measurement Standards and of Calibration and Measurement Certificates issued by National Metrology Institutes (Sèvres: BIPM)
2. Ruhkin A L and Vangel M G 1998 J. Am. Stat. Assoc. 93 303-8
3. Frenkel R B 1999 Metrologia 36 439-54
4. Weise K and Wöger W 2000 Meas. Sci. Technol. 11 1649-58
5. Ballico M 2001 Metrologia 38 155-9
6. Elster C and Link A 2001 Meas. Sci. Technol. 12 1431-8
7. Elster C, Link A and von Martens H-J 2001 Meas. Sci. Technol. 12 1672-7
8. Frenkel R B 2002 Metrologia 39 21-9
9. Beissner K 2002 Metrologia 39 59-63
10. Steele A G, Hill K D and Douglas R J 2002 Metrologia 39 269-77
11. Kacker R, Datla R and Parr A 2002 Metrologia 39 279-93
12. Willink R 2002 Metrologia 39 343-54
13. Cox M G 2002 Metrologia 39 587-8
14. Cox M G 2002 Metrologia 39 589-95
15. Willink R 2003 Metrologia 40 9-17
16. Elster C, Link A and Wöger W 2003 Metrologia 40 189-94
17. Ciarlini P, Cox M, Pavese F and Regoliosi G 2004 Metrologia 41 116-21
18. White D R 2004 Metrologia 41 122-31
19. Kacker R 2004 Metrologia 41 132-6
20. Iyer H K, Wang C M and Vecchia D F 2004 Metrologia 41 223-30
21. Zhang N F, Liu H, Sedransk N and Strawderman W E 2004 Metrologia 41 231-7
22. Sutton C M 2004 Metrologia 41 272-7
23. Kacker R N, Datla R U and Parr A C 2004 Metrologia 41 340-52
24. Toman B 2005 J. Res. Natl Inst. Stand. Technol. 110 605-12
25. Steele A G, Wood B M and Douglas R J 2005 Metrologia 42 32-8
26. Ratel G 2005 Metrologia 42 140-4
27. Steele A G and Douglas R J 2005 Metrologia 42 253-61
28. Wang C M and Iyer H K 2005 Metrologia 42 262-5
29. Pavese F 2005 Metrologia 42 L10-12
30. Kacker R N, Datla R U and Parr A C 2005 Metrologia 42 L13-14
31. Elster C, Wöger W and Cox M G 2005 Meas. Techn. 48 883-93
32. Willink R 2006 Metrologia 43 12-20
33. Steele A G and Douglas R J 2006 Metrologia 43 89-97
34. Willink R 2006 Metrologia 43 S220-30
35. Lira I 2006 Metrologia 43 S231-4
36. Steele A G and Douglas R J 2006 Metrologia 43 S235-43
37. Kharitonov I A and Chunovkina A G 2006 Metrologia 43 470-6
38. Forbes A and Perruchet C 2006 18th IMEKO World Congress (Rio de Janeiro)
39. Toman B 2007 Metrologia 44 L14-17
40. Cox M G 2007 Metrologia 44 187-200
41. Toman B 2007 Technometrics 49 81-7
42. Lira I 2007 Metrologia 44 415-21
43. ISO 1995 Guide to the Expression of Uncertainty in Measurement (Geneva: International Organization for Standardization)
44. BIPM, IEC, IFCC, ILAC, ISO, IUPAC, IUPAP and OIML 2008 Evaluation of Measurement Data - Supplement 1 to the 'Guide to the Expression of Uncertainty in Measurement' - Propagation of Distributions Using a Monte Carlo Method Joint Committee for Guides in Metrology, Bureau International des Poids et Mesures, JCGM 101 at press
45. Lee P M 1989 Bayesian Statistics: An Introduction (New York: Oxford University Press)