Consistency tests for key comparison data

Metrologia

Volumn 41, Issue 4, 2004, Pages 223-230

  Iyer, Hari K ^a,b   Wang, C M ^b   Vecchia, D F ^b  

^a Department of Environmental and Radiological Health Sciences   (United States)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; DEGREES OF FREEDOM (MECHANICS); MEASUREMENT THEORY; POPULATION STATISTICS; STANDARDS; STATISTICAL METHODS;

BILATERAL EQUIVALENCE; DEGREES OF EQUIVALENCE; MUTUAL RECOGNITION ARRANGEMENT (MRA); SIGNIFICANT UNRESOLVED DEVIATION (SUD);

DATA REDUCTION;

EID: 4043067070     PISSN: 00261394     EISSN: None     Source Type: Journal    
DOI: 10.1088/0026-1394/41/4/001     Document Type: Article

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