Magnetic texturing of ferromagnetic thin films by sputtering induced ripple formation

Journal of Applied Physics

Volumn 103, Issue 8, 2008, Pages

  Zhang, K ^a   Uhrmacher, M ^a   Hofsass H ^a   Krauser, J ^b  

^a UNIVERSITY OF GÖTTINGEN   (Germany)

^b HARZ UNIVERSITY OF APPLIED SCIENCES   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

FERROMAGNETIC MATERIALS; FILM THICKNESS; IRON COMPOUNDS; KERR MAGNETOOPTICAL EFFECT; MAGNETIC ANISOTROPY; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SPUTTERING;

MAGNETIC TEXTURING; RIPPLE FORMATION; RIPPLE PATTERNS; SPUTTER EROSION;

THIN FILMS;

EID: 43049087788     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2905324     Document Type: Article

References (33)

1. G. Carter, J. Phys. D 34, R1 (2001).
2. U. Valbusa, C. Boragno, and F. Buatier de Mongeot, Mater. Sci. Eng., C 23, 201 (2003).
3. R. M. Bradley and J. M. Harper, J. Vac. Sci. Technol. A 6, 2390 (1998).
4. E. O. Yewande, R. Kree, and A. Hartmann, Phys. Rev. B 73, 115434 (2006).
5. B. Ziberi, F. Frost, Th. Höche, and B. Rauschenbach, Phys. Rev. B 72, 235310 (2005).
6. D. P. Datta and T. K. Chini, Phys. Rev. B 71, 235308 (2005).
7. S. Facsko, T. Bobek, H. Kurz, T. Dekorsy, S. Kyrsta, and R. Cremer, Appl. Phys. Lett. 80, 130 (2002).
8. S. Habenicht, W. Bolse, H. Feldermann, U. Geyer, H. Hofsäss, K. P. Lieb, and F. Roccaforte, Europhys. Lett. 50, 209 (2000).
9. C. C. Umbach, R. L. Headrick, and K.-C. Chang, Phys. Rev. Lett. 87, 246104 (2001).
10. H. Zhou, Y. Wang, L. Zhou, R. L. Headrick, A. S. Özcan, Y. Wang, G. Özaydin, K. F. Ludwig, Jr., and D. P. Siddons, Phys. Rev. B 75, 155416 (2007).
11. W. L. Chan, N. Pavenayotin, and E. Chason, Phys. Rev. B 69, 245413 (2004).
12. C. Boragno, F. Buatier de Mongeot, G. Costantini, A. Molle, D. de Sanctis, and U. Valbusa, Phys. Rev. B 68, 094102 (2003).
13. K. Zhang, F. Rotter, M. Uhrmacher, C. Ronning, J. Krauser, and H. Hofsäss, New J. Phys. 9, 29 (2007).
14. H. Hofsäss, F. Rotter, M. Uhrmacher, K. Zhang, C. Ronning, and J. Krauser, Surf. Coat. Technol. 201, 8477 (2007).
15. P. Karmakar and D. Ghose, Surf. Sci. 554, L101 (2004).
16. P. Mishra and D. Ghose, Phys. Rev. B 74, 155427 (2006).
17. P. Mishra, P. Karmakar, and D. Ghose, Nucl. Instrum. Methods Phys. Res. B 243, 16 (2006).
18. M. Stepanova and S. K. Dew, J. Vac. Sci. Technol. B 24, 592 (2006).
19. V. B. Shenoy, W. L. Chan, and E. Chason, Phys. Rev. Lett. 98, 256101 (2007).
20. R. Moroni, D. Sekiba, F. Buatier de Mongeot, G. Gonella, C. Boragno, L. Mattera, and U. Valbusa, Phys. Rev. Lett. 91, 167207 (2003).
21. D. Sekiba, R. Moroni, G. Gonella, F. Buatier de Mongeot, C. Boragno, L. Mattera, and U. Valbusa, Appl. Phys. Lett. 84, 762 (2004).
22. R. Moroni, F. Bisio, F. Buatier de Mongeot, M. Canepa, C. Boragno, L. Mattera, and U. Valbusa, Nucl. Instrum. Methods Phys. Res. B 257, 359 (2007).
23. F. Bisio, R. Moroni, F. Buatier de Mongeot, M. Canepa, and L. Mattera, Phys. Rev. Lett. 96, 057204 (2006).
24. M. O. Liedke, B. Liedke, A. Keller, B. Hillebrands, A. Mücklich, S. Facsko, and J. Fassbender, Phys. Rev. B 75, 220407 (2007).
25. C. Suryanarayana and M. Grant Norton, X-ray Diffraction: A Practical Approach (Plenum, New York, 1998), p. 207.
26. A. Guinier, X-ray Diffraction in Crystals, Imperfect Crystals and Amorphous Bodies (Freeman, San Francisco, 1963).
27. H. Hofsäss and K. Khang, Appl. Phys. A: Mater. Sci. Process.. (submitted).
28. H. Hofsäss and K. Zhang, US Patent No. 61/017,319 (pending).
29. N. Barradas, C. Jeynes, and R. P. Webb, Appl. Phys. Lett. 71, 291 (1997).
30. J. F. Ziegler, J. P. Biersack, and U. Littmark, SRIM The stopping and range of ions in matter (SRIM Co., Chester, 2008).
31. S. Chikazumi, Physics of Magnetism (Wiley, New York, 1964), p. 245.
32. E. J. Prucha, Handbook of Optical Constants of Solids (Academic, San Diego, 1998).
33. P. B. Johnson and R. W. Chrity, Phys. Rev. B 9, 5056 (1974).