E′ center in Ge-doped SiO2 glass

Physical Review B - Condensed Matter and Materials Physics

Volumn 70, Issue 15, 2004, Pages

  Tamura, Tomoyuki ^a   Lu, Guang Hong ^b   Kohyama, Masanori ^a   Yamamoto, Ryoichi ^c  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^b UNIVERSITY OF UTAH   (United States)

^c INSTITUTE OF INDUSTRIAL SCIENCE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

GERMANIUM; GLASS; SILICON DIOXIDE;

ARTICLE; CHEMICAL STRUCTURE; ELECTRON; MAGNETISM; REFRACTION INDEX; STRUCTURE ANALYSIS; ULTRAVIOLET RADIATION;

EID: 42749105573     PISSN: 01631829     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevB.70.153201     Document Type: Article

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