Kinetic roughening of the interfaces of Langmuir-Blodgett films

Physical Review B - Condensed Matter and Materials Physics

Volumn 69, Issue 23, 2004, Pages

  Li, Xiu Hong ^a   Li, Ming ^a   Mai, Zhen Hong ^a  

^a INSTITUTE OF PHYSICS   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ARTICLE; ATOMIC FORCE MICROSCOPY; CALCULATION; CORRELATION ANALYSIS; FILM; KINETICS; MATHEMATICAL ANALYSIS; MEMBRANE; MORPHOLOGY; RADIATION SCATTERING; SURFACE TENSION; THICKNESS;

EID: 42749105136     PISSN: 01631829     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevB.69.235407     Document Type: Article

References (33)

1. D. K. Schwartz, Surf. Sci. Rep. 27, 241 (1997); G. G. Roberts, Adv. Phys. 34, 475 (1985); R. H. Tredgold, Order in Thin Organic Films (Cambridge University Press, Cambridge, 1994).
2. D. K. Schwartz, Surf. Sci. Rep. 27, 241 (1997); G. G. Roberts, Adv. Phys. 34, 475 (1985); R. H. Tredgold, Order in Thin Organic Films (Cambridge University Press, Cambridge, 1994).
3. D. K. Schwartz, Surf. Sci. Rep. 27, 241 (1997); G. G. Roberts, Adv. Phys. 34, 475 (1985); R. H. Tredgold, Order in Thin Organic Films (Cambridge University Press, Cambridge, 1994).
4. J. K. Basu, S. Hazra, and M. K. Sanyal, Phys. Rev. Lett. 82, 4675 (1999); J. K. Basu and M. K. Sanyal, ibid. 79, 4617 (1997); J. K. Basu and M. K. Sanyal, Phys. Rep. 363, 1 (2002).
5. J. K. Basu, S. Hazra, and M. K. Sanyal, Phys. Rev. Lett. 82, 4675 (1999); J. K. Basu and M. K. Sanyal, ibid. 79, 4617 (1997); J. K. Basu and M. K. Sanyal, Phys. Rep. 363, 1 (2002).
6. J. K. Basu, S. Hazra, and M. K. Sanyal, Phys. Rev. Lett. 82, 4675 (1999); J. K. Basu and M. K. Sanyal, ibid. 79, 4617 (1997); J. K. Basu and M. K. Sanyal, Phys. Rep. 363, 1 (2002).
7. P. Bassereau and F. Pincet, Langmuir 13, 7003 (1997).
8. V. Nitz, M. Tolan, J. P. Schlomka, O. H. Seeck, J. Stettner, and W. Press, Phys. Rev. B 54, 5038 (1996).
9. A. L. Barabasi, and H. E. Stanley, Fractal Concepts in Surface Growth (Cambridge University Press, Cambridge, 1995).
10. A. C. Durr, F. Schreiber, K. A. Ritley, V. Kruppa, J. Krug, H. Dosch, and B. Struth, Phys. Rev. Lett. 90, 016104 (2003).
11. M. Seul and P. Eisenberger, Phys. Rev. A 39, 4230 (1989).
12. M. Tolan, in X-Ray Scattering from Soft-Matter Thin Films, Springer Tracts in Modern Physics (Springer, New York, 1998), Vol. 148.
13. S. K. Sinha, E. B. Sirota, S. Garoff, and H. B. Stanley, Phys. Rev. B 38, 2297 (1988).
14. G. Palasantzas, Phys. Rev. B 48, 14472 (1993).
15. B. R. McClain, D. D. Lee, B. L. Carvlho, S. G. J. Mochrie, S. H. Chen, and J. D. Lister, Phys. Rev. Lett. 72, 246 (1994).
16. C. Holly and S. Bemstein, Phys. Rev. 49, 403 (1936).
17. S. Karmakar, and V. A. Raghunathan, Phys. Rev. Lett. 91, 098102 (2003).
18. M. Tolan, O. H. Seeck, J. P. Schlomka, W. Press, J. Wang, S. K. Sinha, Z. Li, and M. H. Rafailovich, and J. Sokolov, Phys. Rev. Lett. 81, 2731 (1998).
19. A. Gibaud, N. Cowlam, G. Vignaud, and T. Richardson, Phys. Rev. Lett. 74, 3205 (1995).
20. D. G. Stearns, J. Appl. Phys. 71, 4286 (1992).
21. D. G. Stearns and E. M. Gullikson, Physica B 283, 84 (2000).
22. M. Li, X. H. Li, L. Huang, Q. J. Jia, W. L. Zheng, and Z. H. Mai, Europhys. Lett. 64, 385 (2003).
23. S. F. Edwards and D. R. Wilkinson, Proc. R. Soc. London, Ser. A 381, 17 (1982).
24. M. Lutt, J. P. Schlomka, M. Tolan, J. Stettner, O. H. Seeck, and W. Press, Phys. Rev. B 56, 4085 (1997).
25. T. Salditt, T. H. Metzger, and J. Peisl, Phys. Rev. Lett. 73, 2228 (1994).
26. E. A. L. Mol, J. D. Shindler, A. N. Shalaginov, and W. H. de Jeu, Phys. Rev. E 54, 536 (1996).
27. A. Matsuda, M. Sugi, T. Fukui, S. Lizima, M. Miyahara, and Y. Otsubo, J. Appl. Phys. 48, 771 (1977).
28. L. Bourdieu, P. Silberzan, and D. Chaternay, Phys. Rev. Lett. 67, 2029 (1991).
29. S. W. Hul, R. Viswanathan, J. A. Zasadsinski, and J. N. Israelachvili, Biophys. J. 68, 171 (1995).
30. G. L. Gains, Insoluble Monolayers at Gas-Liquid Interface (Wiley, New York, 1966).
31. R. Stommer and U. Pietsch, J. Phys. D 29, 3161 (1996).
32. Th. Geue, M. Schultz, U. Englisch, R. Stommer, U. Pietsch, K. Meine, and D. Vollhardt, J. Chem. Phys. 110, 8104 (1999).
33. T. Salditt, C. Munster, J. Lu, M. Vogel, W. Fenzl, and A. Souvorov, Phys. Rev. E 60, 7285 (1999).