Electronic properties of FeCl3-intercalated single-wall carbon nanotubes

Physical Review B - Condensed Matter and Materials Physics

Volumn 70, Issue 20, 2004, Pages

  Liu, X ^a   Pichler, T ^a   Knupfer, M ^a   Fink, J ^a   Kataura, H ^b  

^a IFW DRESDEN   (Germany)

^b NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON NANOTUBE;

ABSORPTION SPECTROSCOPY; ARTICLE; CHEMICAL ANALYSIS; ELECTRON DIFFRACTION; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRON TRANSPORT; ENERGY; EXCITATION; NANOTUBE; OPTICAL SPECTROSCOPY;

EID: 42749103894     PISSN: 01631829     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevB.70.205405     Document Type: Article

References (35)

1. S. Iijima, Nature (London) 354, 56 (1991).
2. N. Hamada, S. Sawada, and A. Oshiyama, Phys. Rev. Lett. 68, 1579 (1992).
3. R. Saito, G. Dresselhaus, and M. S. Dresselhaus, Physical Properties of Carbon Nanotubes (Imperial College Press, London, 1998).
4. J. W.G. Wildoer, L. C. Venema, A. G. Rinzler, R. E. Smalley, and C. Dekker, Nature (London) 391, 59 (1998).
5. R. Jacquemin, S. Kazaoui, D. Yu, A. Hassanien, N. Minami, H. Kataura, and Y. Achiba, Synth. Met. 115, 283 (2000); S. Kazaoui, N. Minami, R. Jacquimin, H. Kataura, and Y. Achiba, Phys. Rev. B 60, 13 339 (1999).
6. R. Jacquemin, S. Kazaoui, D. Yu, A. Hassanien, N. Minami, H. Kataura, and Y. Achiba, Synth. Met. 115, 283 (2000); S. Kazaoui, N. Minami, R. Jacquimin, H. Kataura, and Y. Achiba, Phys. Rev. B 60, 13 339 (1999).
7. T. Takenobu, T. Takano, M. Shiraishi, Y. Murakami, M. Ata, H. Kataura, Y. Achiba, and Y. Iwasa, Nat. Mater. 2, 683 (2003).
8. R. S. Lee, H. J. Kim, J. E. Fischer, A. Thess, and R. E. Smalley, Nature (London) 338, 255 (1997).
9. A. M. Rao, P. C. Eklund, S. Bandow, A. Thess, and R. E. Smalley, Nature (London) 388, 257 (1997).
10. T. Pichler, M. Sing, M. Knupfer, M. S. Golden, and J. Fink, Solid State Commun. 109, 721 (1999).
11. P. Petit, C. Mathis, C. Journet, and P. Bernier, Chem. Phys. Lett. 305, 370 (1999).
12. E. Borowiak-Palen, T. Pichler, A. Graff, R. J. Kalenczuk, M. Knupfer, and J. Fink, Carbon 42, 1123 (2004).
13. J. Chen, M. A. Hamon, H. Hu, Y. Chen, A. M. Rao, P. C. Eklund, and R. C. Haddon, Science 282, 95 (1998).
14. H. Kuzmany, A. Kukovecz, F. Simon, M. Holzweber, Ch. Kramberger, and T. Pichler, Synth. Met. 141, 113 (2004).
15. O. Jost, A. A. Gorbunov, W. Pompe, T. Pichler, R. Friedlein, M. Knupfer, M. Reibold, H.-D. Bauer, L. Dunsch, M. S. Golden, and J. Fink, Appl. Phys. Lett. 75, 2217 (1999).
16. H. Kataura, Y. Kumazawa, Y. Maniwa, I. Umezu, S. Suzuki, Y. Ohtsuka, and Y. Achiba, Synth. Met. 103, 2555 (1999).
17. E. J. Mele and J. J. Ritsko, Phys. Rev. Lett. 43, 68 (1979).
18. J. Fink, Adv. Electron. Electron Phys. 75, 121 (1989).
19. A. Thess, R. Lee, P. Nikolaev, H. Dai, P. Petit, J. Robert, C. H. Xu, Y. H. Lee, S. G. Kim, A. G. Rinzler, D. T. Colbert, G. E. Scuseria, D. Tomanek, J. E. Fischer, and R. E. Smalley, Science 273, 483 (1996).
20. A. G. Rinzler, J. Liu, H. Dai, C. B. Huffman, F. Rodriguez-Macias, P. J. Boul, A. H. Lu, D. Heymann, D. T. Colbert, R. S. Lee, J. E. Fischer, A. M. Rao, P. C. Eklund, and R. E. Smalley, Appl. Phys. A: Mater. Sci. Process. 67, 29 (1998).
21. D. Bernaerts, A. Zettl, N. G. Chopra, A. Thess, and R. E. Smalley, Solid State Commun. 105, 145 (1998).
22. H. Kuzmany, W. Plank, M. Hulman, Ch. Kramberger, A. Gruneis, T. Pichler, H. Peterlik, H. Kataura, and Y. Achiba, Eur. Phys. J. B 22, 307 (2001).
23. J. M. Cowley, P. Nikolaev, A. Thess, and R. E. Smalley, Chem. Phys. Lett. 265, 379 (1997); L. Henrard, P. Bernier, C. Journet, and A. Loiseau, Synth. Met. 103, 2533 (1999).
24. J. M. Cowley, P. Nikolaev, A. Thess, and R. E. Smalley, Chem. Phys. Lett. 265, 379 (1997); L. Henrard, P. Bernier, C. Journet, and A. Loiseau, Synth. Met. 103, 2533 (1999).
25. A. Kukovecz, T. Pichler, R. Pfeiffer, and H. Kuzmany, Chem. Commun. (Cambridge) 16, 1730 (2002).
26. A. Kukovecz, T. Pichler, R. Pfeiffer, C. Kramberger, and H. Kuzmany, Phys. Chem. Chem. Phys. 5, 582 (2003).
27. P. A. Brühwiler, A. J. Maxwell, C. Puglia, A. Nilsson, S. Andersson, and N. Mårtensson, Phys. Rev. Lett. 74, 614 (1995).
28. M. Knupfer, Surf. Sci. Rep. 42, 1 (2001).
29. Y. Ma, P. Skytt, N. Wassdahl, P. Glans, J. Guo, and J. Nordgren, Phys. Rev. Lett. 71, 3725 (1993).
30. 3 ions.
31. X. Liu, T. Pichler, M. Knupfer, and J. Fink, Phys. Rev. B 67, 125403 (2003).
32. T. Pichler, M. Knupfer, M. S. Golden, J. Fink, A. G. Rinzler, and R. E. Smalley, Phys. Rev. Lett. 80, 4729 (1998).
33. J. J. Ritsko and M. J. Rice, Phys. Rev. Lett. 42, 666 (1979).
34. J. J. Ritsko and E. J. Mele, Phys. Rev. B 21, 730 (1980).
35. In the de-intercalated sample, the π + σ plasmon is still at the higher energy compared with that of the pristine. One reason is the de-intercalation temperature (500°C) is not high enough to achieve a complete recovery of the pristine sample but the trends show that the de-intercalation process is essentially reversible. Furthermore, in electron diffraction we observe a recovery of the original pattern concomitant with a higher background which might be due to reasons like a partial decomposition of the sample upon the heat treatment. This can also explain the incomplete recovery of the π+ σ plasmon in the low energy loss function.