A framework for empirical classifiers comparison

2006 1st IEEE Conference on Industrial Electronics and Applications

Volumn , Issue , 2006, Pages

  Abdullah, Mohammad Ridzuan Bin ^a   Toh, Kar Ann ^b   Srinivasan, Dipti ^a  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

^b Yonsei University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

COMPARISON BENCHMARKS; DATASETS; EMPIRICAL CLASSIFIERS; RANDOM EFFECTS;

BENCHMARKING; CLASSIFICATION (OF INFORMATION); DATA ACQUISITION; LEARNING SYSTEMS;

PATTERN RECOGNITION;

EID: 42749098742     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICIEA.2006.257073     Document Type: Conference Paper

References (10)

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