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Volumn 354, Issue 19-25, 2008, Pages 2483-2487

Correlation between micro-roughness, surface chemistry, and performance of crystalline Si/amorphous Si:H:Cl hetero-junction solar cells

(4) Matsui, H a Saito, T a Saha, J K a Shirai, H a

a SAITAMA UNIVERSITY (Japan)

Author keywords

Amorphous semiconductors; Chemical vapor deposition; Devices; Diffraction and scattering measurements; Films and coatings; FTIR measurements; Heterojunctions; Microcrystallinity; Microstructure; Optical properties; Photovoltaics; Plasma deposition; Silicon; Solar cells; X ray diffraction

Indexed keywords

FOURIER TRANSFORM INFRARED SPECTROSCOPY; HETEROJUNCTIONS; MEASUREMENT THEORY; MICROSTRUCTURE; OPTICAL PROPERTIES; PHOTOVOLTAIC CELLS; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; SILICON; SOLAR CELLS; X RAY DIFFRACTION ANALYSIS;

FTIR MEASUREMENTS; MICROCRYSTALLINITY; SCATTERING MEASUREMENTS;

AMORPHOUS SEMICONDUCTORS;

EID: 42649136552 PISSN: 00223093 EISSN: None Source Type: Journal
DOI: 10.1016/j.jnoncrysol.2007.10.065 Document Type: Article

Times cited : (4)

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