Experimental investigation and analytical modeling of excess intensity noise in semiconductor class-A lasers

Journal of Lightwave Technology

Volumn 26, Issue 8, 2008, Pages 952-961

  Baili, Ghaya ^a   Bretenaker, Fabien ^a   Alouini, Mehdi ^a   Morvan, Loïc ^a   Dolfi, Daniel ^a   Sagnes, Isabelle ^b  

^a THALES RESEARCH AND TECHNOLOGY   (France)

^b CNRS   (France)

Author keywords

Laser dynamics; Laser noise; Pump noise; Relaxation oscillations

Indexed keywords

BANDWIDTH; MATHEMATICAL MODELS; PHOTOCURRENTS; SHOT NOISE; SURFACE EMITTING LASERS;

LASER DYNAMICS; LASER NOISE; PUMP NOISE; RELAXATION OSCILLATIONS;

SEMICONDUCTOR LASERS;

EID: 42649132173     PISSN: 07338724     EISSN: None     Source Type: Journal    
DOI: 10.1109/JLT.2008.917756     Document Type: Article

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