Ultra-thin polycrystalline Si layers on glass prepared by aluminum-induced layer exchange

Journal of Non-Crystalline Solids

Volumn 354, Issue 19-25, 2008, Pages 2324-2328

  Antesberger, T ^a   Jaeger, C ^a   Stutzmann, M ^a  

^a WALTER SCHOTTKY INSTITUT   (Germany)

Author keywords

Crystal growth; Crystallization; Nucleation; Raman scattering

Indexed keywords

CRYSTAL GROWTH; CRYSTALLIZATION; EUTECTICS; GRAIN GROWTH; NUCLEATION; POLYSILICON; RAMAN SCATTERING; SYNTHESIS (CHEMICAL);

CRYSTALLINE QUALITY; EUTECTIC TEMPERATURE; LAYER EXCHANGE PROCESS;

ULTRATHIN FILMS;

EID: 42649110040     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnoncrysol.2007.09.038     Document Type: Article

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