|
Volumn 354, Issue 19-25, 2008, Pages 2392-2396
|
Deposition of phosphorus doped a-Si:H and μc-Si:H using a novel linear RF source
a
TNO
(Netherlands)
|
Author keywords
Absorption; Chemical vapor deposition; FTIR measurements; Microcrystallinity; Plasma deposition; Reflectivity; Silicon
|
Indexed keywords
DOPING (ADDITIVES);
PLASMA DEPOSITION;
PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION;
REFLECTION;
SILICON COMPOUNDS;
THIN FILMS;
MICROCRYSTALLINITY;
REACTION CHAMBER;
THIN LAYERS;
PHOSPHORUS;
|
EID: 42649091486
PISSN: 00223093
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jnoncrysol.2007.09.024 Document Type: Article |
Times cited : (14)
|
References (8)
|