메뉴 건너뛰기




Volumn , Issue , 2007, Pages 335-338

A generic environment-resistant packaging technology for MEMS

Author keywords

Flip chip transfer; MEMS packaging; Thermal and vibration isolation; Wafer bonding

Indexed keywords

ACTUATORS; CHIP SCALE PACKAGES; COMPOSITE MICROMECHANICS; DIES; ELECTRONIC EQUIPMENT MANUFACTURE; MEMS; MICROELECTROMECHANICAL DEVICES; MICROSYSTEMS; NONMETALS; OPTICAL DESIGN; SENSORS; SILICON; SILICON WAFERS; TECHNOLOGY; TECHNOLOGY TRANSFER; TRANSDUCERS;

EID: 42549155849     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/SENSOR.2007.4300136     Document Type: Conference Paper
Times cited : (29)

References (4)
  • 1
    • 0042564493 scopus 로고    scopus 로고
    • Micropackaging Technologies for Integrated Microsystems: Applications to MEMS and MOEMS
    • K. Najafi, "Micropackaging Technologies for Integrated Microsystems: Applications to MEMS and MOEMS," Proceedings of SPIE, vol. 4979, p. 1, 2003.
    • (2003) Proceedings of SPIE , vol.4979 , pp. 1
    • Najafi, K.1
  • 3
    • 84878155246 scopus 로고    scopus 로고
    • Long-term Reliability, Burn-in and Analysis of Outgassing in Au-Si Eutectic Wafer-level Vacuum Packages
    • Hilton Head Island, SC, Jun
    • J. Mitchell, G. R. Lahiji, and K. Najafi, "Long-term Reliability, Burn-in and Analysis of Outgassing in Au-Si Eutectic Wafer-level Vacuum Packages," in Tech. Dig. Solid- State Sensors, Actuators, and Microsystems Workshop, Hilton Head Island, SC, Jun 2006, pp. 376-379.
    • (2006) Tech. Dig. Solid- State Sensors, Actuators, and Microsystems Workshop , pp. 376-379
    • Mitchell, J.1    Lahiji, G.R.2    Najafi, K.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.