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Volumn , Issue , 2006, Pages 396-399

Shock protection using soft coatings as shock stops

Author keywords

[No Author keywords available]

Indexed keywords

ACTUATORS; CHEMICAL STABILITY; COATINGS; MICROSYSTEMS; SHOCK ABSORBERS; SOLID-STATE SENSORS;

EID: 77951576698     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (4)

References (12)
  • 4
    • 0001743687 scopus 로고
    • The effect of substrate on the elastic properties of films determined by the indentation test-axisymmetric boussinesq problem
    • H. Y. Yu, S. C. Sanday and B. B. Rath, “The effect of substrate on the elastic properties of films determined by the indentation test-axisymmetric boussinesq problem”, J. of the Mechanics and Physics of Solids, 38, 745-64 (1990)
    • (1990) J. of the Mechanics and Physics of Solids , vol.38 , pp. 745-764
    • Yu, H.Y.1    Sanday, S.C.2    Rath, B.B.3
  • 5
    • 33244486310 scopus 로고    scopus 로고
    • Determining hardness of thin films in elastically mismatched film-on-substrate systems using nanoindentation
    • S. M. Han, R. Saha, and W.D. Nix, “Determining hardness of thin films in elastically mismatched film-on-substrate systems using nanoindentation”, Acta Materialia, 54, 1571-81 (2006)
    • (2006) Acta Materialia , vol.54 , pp. 1571-1581
    • Han, S.M.1    Saha, R.2    Nix, W.D.3
  • 6
    • 0035494681 scopus 로고    scopus 로고
    • Numerical study on the measurement of thin film mechanical properties by means of nanoindentation
    • X. Chen and J.J. Vlassak, “Numerical study on the measurement of thin film mechanical properties by means of nanoindentation”, J. Materials Res., 16, 2974-82 (2001)
    • (2001) J. Materials Res. , vol.16 , pp. 2974-2982
    • Chen, X.1    Vlassak, J.J.2
  • 10
    • 29244473558 scopus 로고    scopus 로고
    • Characterization of low-temperature wafer bonding using thin-film parylene
    • H. Kim and K. Najafi, “Characterization of low-temperature wafer bonding using thin-film parylene”, IEEE J. of Microelectromechanical Systems, 14, 1347-55 (2005)
    • (2005) IEEE J. of Microelectromechanical Systems , vol.14 , pp. 1347-1355
    • Kim, H.1    Najafi, K.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.