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Volumn 18, Issue 2, 2008, Pages
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The fabrication, characterization and testing of a MEMS circular diaphragm mass sensor
c
CSEM
(Switzerland)
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Author keywords
[No Author keywords available]
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Indexed keywords
CRYSTALLINE MATERIALS;
ELECTROSTATICS;
LASER DOPPLER VELOCIMETERS;
MEMS;
SILICON ON INSULATOR TECHNOLOGY;
SILICON WAFERS;
CIRCULAR DIAPHRAGM MASS SENSORS;
LASER DOPPLER VIBROMETRY;
OPTICAL SURFACE PROFILOMETRY;
MICROSENSORS;
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EID: 42549114192
PISSN: 09601317
EISSN: 13616439
Source Type: Journal
DOI: 10.1088/0960-1317/18/2/025021 Document Type: Article |
Times cited : (28)
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References (11)
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