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Volumn 76, Issue 1-3, 1999, Pages 283-292
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Development and characterization of a surface micromachined FET pressure sensor on a CMOS process
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Author keywords
[No Author keywords available]
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Indexed keywords
CMOS INTEGRATED CIRCUITS;
COMPUTER SIMULATION;
FIELD EFFECT TRANSISTORS;
FINITE ELEMENT METHOD;
MICROELECTROMECHANICAL DEVICES;
PARTIAL PRESSURE SENSORS;
SEMICONDUCTING SILICON;
POLYSILICON;
PRESSURE SENSOR;
MICROSENSORS;
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EID: 0343932621
PISSN: 09244247
EISSN: None
Source Type: Journal
DOI: 10.1016/S0924-4247(99)00058-8 Document Type: Article |
Times cited : (31)
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References (5)
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