Study of performance and leakage currents in nanometer-scale bulk, SOI and double-gate MOSFETs

Journal of Computational Electronics

Volumn 7, Issue 1, 2008, Pages 24-27

  Narayanan, Sudarshan ^a   Sachs, C ^a   Fischetti, M V ^a  

^a UNIVERSITY OF MASSACHUSETTS   (United States)

Author keywords

High dielectric stack; Zener tunneling

Indexed keywords

GATES (TRANSISTOR); GREEN'S FUNCTION; LEAKAGE CURRENTS; OPTIMIZATION; SEMICONDUCTING GERMANIUM; SEMICONDUCTING INDIUM GALLIUM ARSENIDE; SEMICONDUCTING SILICON; SILICON ON INSULATOR TECHNOLOGY;

DOUBLE-GATE MOSFETS; GATE TUNNELING CURRENTS; ZENER TUNNELING;

MOSFET DEVICES;

EID: 42549097003     PISSN: 15698025     EISSN: 15728137     Source Type: Journal    
DOI: 10.1007/s10825-008-0228-0     Document Type: Article

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