Crystallographic characteristics of nanostructured thin-film fuel cell electrocatalysts: A HRTEM study

Chemistry of Materials

Volumn 20, Issue 7, 2008, Pages 2444-2454

  Gancs, Lajos ^a   Kobayashi, Takeshi ^a   Debe, Mark K ^b   Atanasoski, Radoslav ^b   Wieckowski, Andrzej ^a  

^a UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

^b 3M COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC SCALE ROUGHNESS; DIFFRACTOGRAM INDEXING;

ELECTROCATALYSTS; NANOSTRUCTURED MATERIALS; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY;

CRYSTALLOGRAPHY;

EID: 42449143057     PISSN: 08974756     EISSN: None     Source Type: Journal    
DOI: 10.1021/cm702992b     Document Type: Article

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