|
Volumn 66, Issue SUPPL. 1, 1998, Pages
|
Theoretical study of the resistance of short. Xe/n wires within an STM junction: The Xe/2 case
|
Author keywords
[No Author keywords available]
|
Indexed keywords
DESTRUCTIVE INTERFERENCE;
EXPERIMENTAL STUDIES;
INTERFERENCE EFFECTS;
JUNCTION RESISTANCES;
THEORETICAL STUDY;
TIGHT BINDING MODEL;
TUNNELING PATHS;
MOLECULAR DYNAMICS;
XENON;
ATOMS;
|
EID: 4244137930
PISSN: 09478396
EISSN: 14320630
Source Type: Journal
DOI: 10.1007/s003390051259 Document Type: Article |
Times cited : (2)
|
References (22)
|