Van der Waals atomic trap in a scanning-tunneling-microscope junction:Tip shape, dynamical effects, and tunnel current signatures

Physical Review B - Condensed Matter and Materials Physics

Volumn 55, Issue 24, 1997, Pages 16498-16498

  Bouju, X ^a   Girard, Ch ^a   Tang, H ^b   Joachim, C ^b   Pizzagalli, L ^b  

^a UNIVERSITÉ DE FRANCHE COMTÉ   (France)

^b Centre d'Élaboration de Matériaux et d'Études Structurales   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001206531     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.55.16498     Document Type: Article

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