Charge ordering in (formula presented) (formula presented) studied by electron-energy-loss spectroscopy

Physical Review B - Condensed Matter and Materials Physics

Volumn 59, Issue 9, 1999, Pages 6395-6399

  Murakami, Y ^a   Shindo, D ^a   Chiba, H ^b   Kikuchi, M ^b   Syono, Y ^b  

^a TOHOKU UNIVERSITY   (Japan)

^b TOHOKU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 4244107179     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.59.6395     Document Type: Article

References (22)

1. For example, Y. Tokura, Phys. Rev. Lett.76, 3184 (1996).
2. For example, H. Kuwahara, Science270, 961 (1995).
3. For example, C H. Chen and S.-W. Cheong, Phys. Rev. Lett.76, 3188 (1996).
4. E O. Wollan and W C. Koehler, Phys. Rev.100, 545 (1955).
5. H. Chiba, Solid State Commun.99, 499 (1996).
6. H. Chiba, Solid State Ionics108, 193 (1998).
7. Y. Murakami, Phys. Rev. B55, 15 043 (1997).
8. A. Asamitsu, Nature (London)373, 407 (1995).
9. J B. Torrance, Phys. Rev. B45, 8209 (1992).
10. A. Sundaresan, Phys. Rev. B57, 2690 (1998).
11. D. Shindo, Ultramicroscopy54, 221 (1994).
12. A. Taniyama, D. Shindo, and T. Oikawa, J. Electron Microsc.16, 303 (1997).
13. R F. Egerton, Electron Energy-Loss Spectroscopy in the Electron Microscope (Plenum, New York, 1986).
14. H. Kurata, Phys. Rev. B47, 13 763 (1993).
15. H. Kurata and C. Colliex, Phys. Rev. B48, 2102 (1993).
16. For example, S. Satpathy, Z S. Popovic, and F R. Vukajlovic, Phys. Rev. Lett.76, 960 (1996).
17. G. Zampieri, Phys. Rev. B58, 3755 (1998).
18. J H. Park, Phys. Rev. Lett.76, 4215 (1996).
19. D. Shindo, Jpn. J. Appl. Phys., Part 137, 2593 (1998).
20. J M. Cowley, Diffraction Physics (North-Holland, Amsterdam, 1975).
21. B J. Sternlieb, Phys. Rev. Lett.76, 2169 (1996).
22. H L. Ju, H.-C. Sohn, and K M. Krishnan, Phys. Rev. Lett.79, 3230 (1997).