Detective quantum efficiency of the 25 μm pixel size imaging plate for transmission electron microscopes

Journal of Electron Microscopy

Volumn 46, Issue 4, 1997, Pages 303-310

  Taniyama, Akira ^a   Shindo, Daisuke ^a   Oikawa, Tetsuo ^b  

^a TOHOKU UNIVERSITY   (Japan)

^b JEOL LTD   (Japan)

Author keywords

Detective quantum efficiency (DQE); Imaging Plate (IP); Quantitative analysis; Recording device; Signal to noise ratio (S N); TEM

Indexed keywords

ELECTRONS; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; PIXELS; QUANTUM EFFICIENCY;

DETECTIVE QUANTUM EFFICIENCY; HIGH EXPOSURES; IMAGING PLATE; INCIDENT ELECTRONS; PIXEL SIZE; RECORDING DEVICES; SIGNAL TO NOISE RATIO (S/N); TRANSMISSION ELECTRON;

SIGNAL TO NOISE RATIO;

EID: 0030847612     PISSN: 00220744     EISSN: None     Source Type: Journal    
DOI: 10.1093/oxfordjournals.jmicro.a023523     Document Type: Article

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