In situ X-ray characterization of oligophenylene thin films prepared by organic molecular beam deposition

Applied Surface Science

Volumn 130-132, Issue , 1998, Pages 651-657

  Yoshida, Yuji ^a   Takiguchi, Hiroshi ^a   Hanada, Takeshi ^a   Tanigaki, Nobutaka ^a   Han, Eun Mi ^a   Yase, Kiyoshi ^a  

^a NATL INST OF MAT AND CHEM RES   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

AROMATIC POLYMERS; DEPOSITION; FILM PREPARATION; MOLECULAR ORIENTATION; OLIGOMERS; SILICA; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

OLIGOPHENYLENES; ORGANIC MOLECULAR BEAM DEPOSITION (OMBD); TOTAL REFLECTION X RAY DIFFRACTION (TXRD);

PLASTIC FILMS;

EID: 4243952644     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(98)00133-0     Document Type: Article

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