Evaluation of thin films of functional organic materials by total reflection X-ray diffraction

Molecular Crystals and Liquid Crystals Science and Technology Section A: Molecular Crystals and Liquid Crystals

Volumn 280, Issue , 1996, Pages 271-276

  Yoshida, Yuji ^a   Tanigaki, Nobutaka ^a   Yase, Kiyoshi ^a  

^a NATL INST OF MAT AND CHEM RES   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL STRUCTURE; LEAD COMPOUNDS; MOLECULAR BEAMS; MOLECULAR ORIENTATION; POTASSIUM COMPOUNDS; SILICON; SUBSTRATES; SURFACES; VACUUM APPLICATIONS; VAPOR DEPOSITION; X RAY CRYSTALLOGRAPHY;

LEAD PHTHALOCYANINE; MONOCLINIC CRYSTALS; ORGANIC MOLECULAR BEAM DEPOSITION; POTASSIUM BROMIDE; TOTAL REFLECTION X RAY DIFFRACTION; TRICLINIC CRYSTALS;

THIN FILMS;

EID: 0029721537     PISSN: 1058725X     EISSN: None     Source Type: Journal    
DOI: 10.1080/10587259608040342     Document Type: Article

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