Real-time optical monitoring of the heteroepitaxy of oxides by an oblique-incidence reflectance difference technique

Physical Review B - Condensed Matter and Materials Physics

Volumn 61, Issue 15, 2000, Pages 10404-10410

  Chen, Fan ^a   Lu, Huibin ^a   Zhao, Tong ^a   Jin, Kui juan ^a   Chen, Zhenghao ^a   Yang, Guozhen ^a  

^a INSTITUTE OF PHYSICS   (China)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 4243928640     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.61.10404     Document Type: Article

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