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Physical Review B - Condensed Matter and Materials Physics

Volumn 63, Issue 8, 2001, Pages 854011-8540115

Morphology of multilayer Ag/Ag(100) films versus deposition temperature: STM analysis and atomistic lattice-gas modeling

(5) Stoldt, C R a Caspersen, K J a Bartelt, M C b Thiel, P A a Evans, J W c

a IOWA STATE UNIVERSITY (United States)

b LAWRENCE LIVERMORE NATIONAL LABORATORY (United States)

c IOWA STATE UNIVERSITY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

SILVER;

ADSORPTION; ARTICLE; CRYSTALLIZATION; DIFFUSION; FILM; IMAGING; MODEL; NANOPARTICLE; SCANNING TUNNELING MICROSCOPY; STRUCTURE ANALYSIS; SURFACE PROPERTY; TEMPERATURE DEPENDENCE;

EID: 4243458408 PISSN: 01631829 EISSN: None Source Type: Journal
DOI: None Document Type: Article

Times cited : (62)

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