Determination of interlayer diffusion parameters for Ag/Ag(111)

Physical Review Letters

Volumn 85, Issue 7, 2000, Pages 1480-1483

  Roos, K R ^a   Tringides, M C ^b  

^a BRADLEY UNIVERSITY   (United States)

^b IOWA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC PHYSICS; COMPUTER SIMULATION; DEPOSITION; EPITAXIAL GROWTH; FILM GROWTH; MONTE CARLO METHODS; PROBABILITY; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; SCANNING TUNNELING MICROSCOPY; SILVER;

INTERLAYER DIFFUSION; SUBMONOLAYER GROWTH; TERRACE DIFFUSION;

DIFFUSION IN SOLIDS;

EID: 0034248325     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevLett.85.1480     Document Type: Article

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