Using temperature to tune film roughness: nonintuitive behavior in a simple system

Physical Review Letters

Volumn 85, Issue 4, 2000, Pages 800-803

  Stoldt, C R ^a   Caspersen, K J ^a   Bartelt, M C ^b   Jenks, C J ^a   Evans, J W ^a   Thiel, P A ^a  

^a IOWA STATE UNIVERSITY   (United States)

^b SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; EPITAXIAL GROWTH; FILM GROWTH; MATHEMATICAL MODELS; PHASE TRANSITIONS; RANDOM PROCESSES; SCANNING TUNNELING MICROSCOPY; TEMPERATURE; THIN FILMS;

KINETIC ROUGHENING; SELF AFFINE GROWTH;

SURFACE ROUGHNESS;

EID: 0034224823     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevLett.85.800     Document Type: Article

References (23)

1. Morphological Organization in Epitaxial Growth and Removal, edited by Z. Zhang and M. G. Lagally (World Scientific, Singapore, 1998).
2. Special issue on Magnetism on a Microscopic Scale [MRS Bull. 20, No. 10 (1995)]; K. L. Ekinci and J. M. Vallès, Phys. Rev. B 58, 7347 (1998).
3. Special issue on Magnetism on a Microscopic Scale [MRS Bull. 20, No. 10 (1995)]; K. L. Ekinci and J. M. Vallès, Phys. Rev. B 58, 7347 (1998).
4. A.-L. Barabasi and H. E. Stanley, Fractal Concepts in Surface Growth (Cambridge University Press, Cambridge, 1995).
5. R. Kunkel et al., Phys. Rev. Lett. 65, 733 (1990); F. Tsui et al., ibid. 76, 3164 (1996).
6. R. Kunkel et al., Phys. Rev. Lett. 65, 733 (1990); F. Tsui et al., ibid. 76, 3164 (1996).
7. W. F. Egelhoff and I. Jacob, Phys. Rev. Lett. 62, 921 (1989).
8. W. C. Elliot et al., Phys. Rev. B 54, 17938 (1996).
9. H.-J. Ernst et al., Phys. Rev. Lett. 72, 112 (1994).
10. C.-M. Zhang et al., Surf. Sci. 406, 178 (1998).
11. M. V. R. Murty and B. H. Cooper, Phys. Rev. Lett. 83, 352 (1999); J. G. Amar and F. Family, ibid. 77, 4584 (1996).
12. M. V. R. Murty and B. H. Cooper, Phys. Rev. Lett. 83, 352 (1999); J. G. Amar and F. Family, ibid. 77, 4584 (1996).
13. J. Villain, J. Phys. I (France) 1, 19 (1991).
14. M. C. Bartelt and J. W. Evans, Phys. Rev. Lett. 75, 4250 (1995); Surf. Sci. 423, 189 (1999).
15. M. C. Bartelt and J. W. Evans, Phys. Rev. Lett. 75, 4250 (1995); Surf. Sci. 423, 189 (1999).
16. B.D. Yu and M. Scheffler, Phys. Rev. Lett. 77, 1095 (1996).
17. U. Kurpick and T. S. Rahman, Phys. Rev. B 57, 2482 (1998).
18. C. L. Kelchner and A. E. DePristo, Surf. Sci. 393, 72 (1997).
19. M. Siegert, Phys. Rev. Lett. 81, 5481 (1998); L.-H. Tang, P. Smilauer, and D. D. Vvedensky, Eur. Phys. J. B 2, 409 (1998); J.G. Amar, Phys. Rev. B 60, R11 317 (1999).
20. M. Siegert, Phys. Rev. Lett. 81, 5481 (1998); L.-H. Tang, P. Smilauer, and D. D. Vvedensky, Eur. Phys. J. B 2, 409 (1998); J.G. Amar, Phys. Rev. B 60, R11 317 (1999).
21. M. Siegert, Phys. Rev. Lett. 81, 5481 (1998); L.-H. Tang, P. Smilauer, and D. D. Vvedensky, Eur. Phys. J. B 2, 409 (1998); J.G. Amar, Phys. Rev. B 60, R11 317 (1999).
22. L. Golubovic, Phys. Rev. Lett. 78, 90 (1997); P. Politi and A. Torcini, J. Phys. A 33, L77 (2000).
23. L. Golubovic, Phys. Rev. Lett. 78, 90 (1997); P. Politi and A. Torcini, J. Phys. A 33, L77 (2000).