Micro-optics test bench at the ESRF

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 6705, Issue , 2007, Pages

  Snigirev, A ^a   Hustache, R ^a   Duboc, P ^a   Massonnat, J Y ^a   Claustre, L ^a   Van Vaerenbergh, P ^a   Snigireva, I ^a   Grigoriev, M ^b   Yunkin, V ^b  

^a EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^b INSTITUTE OF MICROELECTRONICS TECHNOLOGY AND HIGH PURITY MATERIALS   (Russian Federation)

Author keywords

Microfocusing; X ray optics

Indexed keywords

CHARACTERIZATION; DIFFRACTIVE OPTICAL ELEMENTS; IMAGING SYSTEMS; MAGNETIC MOMENTS; MAGNETS; REFRACTIVE INDEX;

MICROFOCUSING; REFLECTIVE OPTICS; VERSATILE INSTRUMENTS;

MICROOPTICS;

EID: 42149182572     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.732450     Document Type: Conference Paper

References (7)

1. http://www.esrf.fr/UsersAndScience/Experiments/Imaging/BM05/.
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4. I. Snigireva, A. Snigirev, V. Kohn, V. Yunkin, M. Grigoriev, S. Kuznetsov, G. Vaughan, M. Di Michiel, Phys. Sta. Sol. (a) 204, 2817-2823, (2007).
5. A. Snigirev, A. Bjeoumikhov, A. Erko, I. Snigireva, M. Grigoriev, V. Yunkin, M. Erko and S. Bjeoumikhova, Journal of Synchrotron radiation, 14, 326-330, (2007).
6. T. Bigault, E. Ziegler, C. Morawe, R. Hustache, J. Y. Massonnat, G. Rostaing, in Crsyatls, Multilayers, and Other Synchrotron Optics, edited by T. Ishikawa, A. T. Macrander, J. Wood, Proceedings of SPIE vol. 5195, 12-20 (2003).
7. A.Snigirev, I. Snigireva, M. Drakopoulos, V.Nazmov, E.Reznikova, S. Kuznetsov, M. Grigoriev, J.Mohr, V.Saile, Proceedings of SPIE vol. 5195, 21-31 (2003).