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Volumn 92, Issue 14, 2008, Pages

Determination of the intrinsic parameters of Sn Bi4 Se7 via the characterization of electrical properties

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CONDUCTIVITY; ELECTRIC SPACE CHARGE; ELECTRONS; OHMIC CONTACTS; POLYCRYSTALLINE MATERIALS;

EID: 42149130379     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2905262     Document Type: Article
Times cited : (1)

References (18)
  • 1
    • 0039603837 scopus 로고
    • in Amorphe und Polykristalline Halbleiter, edited by W. Heywang (Springer, Berlin),.
    • U. Birkholz, in Amorphe und Polykristalline Halbleiter, edited by, W. Heywang, (Springer, Berlin, 1984), p. 77.
    • (1984) , pp. 77
    • Birkholz, U.1
  • 8
    • 42149101056 scopus 로고
    • Physics of Semiconductor Devices, 2nd ed. (Wiley, Singapore), Cha and references therein.
    • S. M. Sze, Physics of Semiconductor Devices, 2nd ed. (Wiley, Singapore, 1981), Chap. and references therein.
    • (1981)
    • Sze, S.M.1
  • 12
    • 42149146656 scopus 로고
    • Semiconductors Statistics (Pergamon, Oxford).
    • J. S. Blakemore, Semiconductors Statistics (Pergamon, Oxford, 1962).
    • (1962)
    • Blakemore, J.S.1
  • 16
    • 42149113383 scopus 로고
    • Semiconducting Materials (Butterworths Scientific, London).
    • G. W. Castellan and F. Seitz, Semiconducting Materials (Butterworths Scientific, London, 1951).
    • (1951)
    • Castellan, G.W.1    Seitz, F.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.